发明名称 A method for forming thick dielectric regions using etched trenches
摘要 A method of manufacturing a semiconductor device includes providing a semiconductor substrate having first and second main surfaces opposite to each other. The method also includes providing in the semiconductor substrate one or more trenches, first mesas and second mesas. The method also includes oxidizing sidewalls and bottoms of each trench; depositing a doped oxide into each trench and on the tops of the first and second mesas; and thermally oxidizing the semiconductor substrate at a temperature sufficient enough to cause the deposited oxide to flow so that the silicon in each of the first mesas is completely converted to silicon dioxide while the silicon in each of the second mesas is only partially converted to silicon dioxide and so that each of the trenches is filled with oxide.
申请公布号 WO2005065127(B1) 申请公布日期 2006.06.29
申请号 WO2004US40985 申请日期 2004.12.08
申请人 THIRD DIMENSION (3D) SEMICONDUCTOR, INC. 发明人 BLANCHARD, RICHARD, A.
分类号 H01L21/762;H01L21/265;H01L21/331;H01L21/336;H01L29/06 主分类号 H01L21/762
代理机构 代理人
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