发明名称 Semiconductor device with multiple gate dielectric layers and method for fabricating the same
摘要 Disclosed are a semiconductor device with dual gate dielectric layers and a method for fabricating the same. The semiconductor device includes: a silicon substrate divided into a cell region where NMOS transistors are formed and a peripheral region where NMOS and PMOS transistors are formed; a targeted silicon oxide layer formed on the silicon substrate in the cell region; an oxynitride layer formed on the silicon substrate in the peripheral region; a first gate structure formed in the cell region; a second gate structure formed on the oxynitride layer in an NMOS region of the peripheral region; and a third gate structure formed on the oxynitride layer in a PMOS region of the peripheral region.
申请公布号 US2006138550(A1) 申请公布日期 2006.06.29
申请号 US20050227156 申请日期 2005.09.16
申请人 HYNIX SEMICONDUCTOR, INC. 发明人 CHO HEUNG-JAE;LIM KWAN-YONG;LEE SEUNG-RYONG
分类号 H01L29/78;H01L21/8238 主分类号 H01L29/78
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