发明名称 SEMICONDUCTOR WAFER, ITS POSITIONING METHOD AND LASER TRIMMING METHOD
摘要 PROBLEM TO BE SOLVED: To position a semiconductor wafer without using a positioning-only alignment mark. SOLUTION: The semiconductor wafer 2 has an X-axis direction scanning region A where only one wiring pattern 10 having a width which is not larger than a positioning laser diameter, within a range where a positioning laser beam is scanned in an X-axis direction is formed in a Y-axis direction, and a Y-axis direction scanning region B where only one wiring pattern 10 having the width which is not larger than the positioning laser diameter, within a range where the positioning laser beam is scanned in the Y-axis direction is formed in the X-axis direction are installed near a pad opening 8 in a chip region 4. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006173218(A) 申请公布日期 2006.06.29
申请号 JP20040360725 申请日期 2004.12.14
申请人 RICOH CO LTD 发明人 MORI KATAHIDE;WATANABE HIROBUMI;KATO HIDEKI
分类号 H01L21/82;H01L21/68 主分类号 H01L21/82
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