| 摘要 |
PROBLEM TO BE SOLVED: To reduce costs for a test by shortening time for testing a semiconductor memory having an error correction function and a data compression test function. SOLUTION: In a first data compression test mode for invalidating the error correction function, first test data TWD1 is written in a first regular memory block MB1. Second test data TWD2 is written not only in a second regular memory block MB2 but also in a parity memory block PMB. By changing the number of bits (data compression rate) for distributing the first and second test data TWD 1 and 2, a data compression test to the parity memory block PMB can be carried out without increasing the number of test terminals. As a result of this, the time for the test is shortened to reduce the costs for the test. COPYRIGHT: (C)2006,JPO&NCIPI
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