发明名称 HEAT TREATMENT APPARATUS AND METHOD FOR SEMICONDUCTOR WAFER
摘要 PROBLEM TO BE SOLVED: To improve productivity by reducing a heat treatment time by cooling a semiconductor wafer in the carries of a heat treatment apparatus for a semiconductor wafer. SOLUTION: The apparatus has a direct acting type semiconductor wafer carrier. The semiconductor wafer carrier has a carrying arm 2C for mounting a semiconductor wafer, and a piping part 3S having a hollow portion which is the passage of a medium used for cooling the semiconductor wafer. In the heat treatment apparatus, the connecting configuration between an exhaust piping part in the semiconductor wafer carrier and the separation/junction part of an external piping to be inserted to a cabinet is a shield method using an O ring. A medium delivered through the piping part of a wafer carrier is discharged or supplied from an opening provided on the semiconductor wafer mount surface of a carrying arm for mounting the semiconductor wafer. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006173355(A) 申请公布日期 2006.06.29
申请号 JP20040363711 申请日期 2004.12.15
申请人 NEC CORP 发明人 DOUKAWA YOSHIHIRO;YAMAGATA SHINJI
分类号 H01L21/677;B65G49/07;H01L21/22 主分类号 H01L21/677
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