发明名称 Lithographic apparatus and device manufacturing method
摘要 A lithographic apparatus includes an illumination system configured to provide a radiation beam; a patterning device configured to pattern the radiation beam to form a patterned radiation beam; and a projection system configured to project the patterned radiation beam onto a substrate. An optical assembly includes multiple optical elements two-dimensionally arranged between a radiation source and the patterning device to create a predetermined angular distribution of the radiation beam. In order to improve the uniformity of the radiation beam the optical elements are selected from a predetermined number of optical elements having different shapes and/or sizes.
申请公布号 US2006139599(A1) 申请公布日期 2006.06.29
申请号 US20040019525 申请日期 2004.12.23
申请人 ASML NETHERLANDS B.V. 发明人 KRUIJSWIJK STEFAN G.;MARIE DIERICHS MARCEL MATHIJS T.;EURLINGS MARKUS FRANCISCUS A.;MULDER HEINE M.
分类号 G03B27/54 主分类号 G03B27/54
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