发明名称 Lithographic apparatus and device manufacturing method
摘要 A lithography apparatus including a projection system configured to project a beam of radiation as an array of sub-beams of radiation and an array of individually controllable elements configured to modulate the sub-beams of radiation to form a requested dose pattern on a substrate. The requested dose pattern is built up over time from an array of localized exposures in which at least neighboring localized exposures are imaged at substantially different times and in which each localized exposure is produced by one of the sub-beams of radiation. The lithography apparatus also includes a rasterizer device arranged to convert data defining the requested dose pattern to a sequence of data representing the requested dose at a corresponding sequence ofpoints within the pattern, and also a data manipulation device arranged to receive the sequence of data and constitute a control signal suitable for controlling the array of individually controllable elements.
申请公布号 EP1674933(A2) 申请公布日期 2006.06.28
申请号 EP20050257659 申请日期 2005.12.14
申请人 ASML NETHERLANDS B.V. 发明人 BONTEKOE, MARCEL;TINNEMANS, PATRICIUS ALOYSIUS JACOBUS;KESSELS, LAMBERTUS GERARDUS MARIA;VAN HASSEL, MARCO CORNELIS JACOBUS MARTINUS;MULCKHUYSE, WOUTER, FRANS WILLEM
分类号 G03F7/20 主分类号 G03F7/20
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