| 摘要 |
An analyzer or spectrophotometer for the detection of material in a sample comprises: a source adapted to direct radiation at least at the sample where the radiation is able to be varied; a detector for detecting at least radiation reflected by the sample, wherein the detector having a spectral response able to be varied and an output depending on radiation incident thereon and the spectral response; a controller or processor receiving the output, configured or programmed to vary the intensity of the source, vary the spectral response of the detector; and determine a characteristic of the sample based on the output in relation to the variations. |
