发明名称 Atomic layer deposition method of forming an oxide comprising layer on a substrate
摘要 This invention includes atomic layer deposition methods of depositing oxide comprising layers on substrates. In one implementation, a substrate is positioned within a deposition chamber. A first species is chemisorbed to form a first species monolayer onto the substrate within the deposition chamber from a gaseous first precursor. The chemisorbed first species is contacted with a gaseous second precursor effective to react with the first species to form an oxide of a component of the first species monolayer. The contacting at least in part results from flowing O<SUB>3 </SUB>to the deposition chamber, with the O<SUB>3 </SUB>being at a temperature of at least 170° C. at a location where it is emitted into the deposition chamber. The chemisorbing and the contacting are successively repeated to form an oxide comprising layer on the substrate. Additional aspects and implementations are contemplated.
申请公布号 US7067438(B2) 申请公布日期 2006.06.27
申请号 US20040783242 申请日期 2004.02.19
申请人 MICRON TECHNOLOGY, INC. 发明人 DERDERIAN GARO J.;SARIGIANNIS DEMETRIUS;MENG SHUANG
分类号 H01L21/31;C23C16/40;C23C16/44;C23C16/455;H01L21/20;H01L21/314;H01L21/469;H01L21/8238;H01L21/8242 主分类号 H01L21/31
代理机构 代理人
主权项
地址