发明名称 Accurate sampling technique for ADC
摘要 A time interleaved ADC system includes a delay circuit that has a dynamically adjusted speed to achieve uniformly spaced sampling intervals. The adjustment control circuit monitors the sampling pulses associated with sampling time instant for each ADC, and provides one or more control signals to the delay circuit. In one example, the adjustment control circuit employs a phase detector circuit, an integrator circuit, and a dynamic biasing circuit. In this example, the phase detector circuit evaluates the sampling pulses to generate control signals for the integrator circuit, which generates signals that are utilized by the dynamic biasing circuit to adjust the delays associated with the delay circuit. The relative positions of the sampling pulses are controlled by adjusting the delay in the delay circuit.
申请公布号 US7068195(B1) 申请公布日期 2006.06.27
申请号 US20050119199 申请日期 2005.04.29
申请人 NATIONAL SEMICONDUCTOR CORPORATION 发明人 MENKUS CHRISTOPHER ALAN
分类号 H03M1/00;H03L7/00 主分类号 H03M1/00
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