发明名称 Methods of removing resistive remnants from contact holes using silicidation
摘要 A contact hole can be formed in an insulating layer to expose a surface of an underlying silicon layer at a bottom of the contact hole having a first size. A metal silicide layer can be formed beneath the bottom of the contact hole and removed to form a void beneath the contact hole having a second size that is greater than the first size.
申请公布号 US7067417(B2) 申请公布日期 2006.06.27
申请号 US20040881642 申请日期 2004.06.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK HEE-SOOK;CHOI GIL-HEYUN;LEE JONG-MYEONG
分类号 H01L21/28;H01L21/4763;H01L21/00;H01L21/306;H01L21/311;H01L21/3213;H01L21/60;H01L21/768;H01L21/8242 主分类号 H01L21/28
代理机构 代理人
主权项
地址