发明名称 Exposure system, exposure method and method for manufacturing a semiconductor device
摘要 An exposure system includes: an illumination optical system defining, in an effective illumination source plane, a center region forming a perpendicularly incident light and first and second eccentric regions forming obliquely incident lights having a perpendicular electric vector component perpendicular to a straight line connecting the first and second eccentric regions, the electric vector component being larger than a parallel electric vector component parallel to the straight line, and illuminating the mask pattern with the perpendicularly incident light and the obliquely incident lights; and a projection optical system projecting an image of the mask pattern to a processing object.
申请公布号 US2006132748(A1) 申请公布日期 2006.06.22
申请号 US20050298706 申请日期 2005.12.12
申请人 FUKUHARA KAZUYA 发明人 FUKUHARA KAZUYA
分类号 G03B27/54 主分类号 G03B27/54
代理机构 代理人
主权项
地址
您可能感兴趣的专利