TEST ARRANGEMENT INCLUDING ANISOTROPIC CONDUCTIVE FILM FOR TESTING POWER MODULE
摘要
A testing apparatus and method for testing a semiconductor device, and more particularly a test arrangement for measuring a guaranteed power loss of a semiconductor module, not requiring the module to have on-board decoupling capacitors for the power loss test. The conventional pogo-pin array and test socket are replaced by a novel low cost anisotropic conductive elastomer and a low cost socket, the conductive polymer providing electrical communication between the socket and the module under test.
申请公布号
WO2005121825(A3)
申请公布日期
2006.06.22
申请号
WO2005US19517
申请日期
2005.06.02
申请人
INTERNATIONAL RECTIFIER CORPORATION;SCHAFFER, CHRISTOPHER P.;STRYDOM, JOHAN;CIUFFOLI, ANDREA
发明人
SCHAFFER, CHRISTOPHER P.;STRYDOM, JOHAN;CIUFFOLI, ANDREA