发明名称 Timing skew measurement system
摘要 An improved timing skew measurement system includes a selector receiving a plurality of input signals whose relative skew is to be measured, a selection controller connected to the select inputs of the selector for selecting one of the input signals and a sequential logic element having a first input connected to the output of the selector. The system further includes a controllable clock generator capable of providing an adjustable clock edge position connected to a second input of the sequential logic element, the first and second inputs being associated by at least one defined timing relationship for correct operation of the sequential logic element, and an output analyzer having one input connected to the output of the sequential logic element, a first output connected to the input of the selection controller and a second output connected to the control input of the controllable clock generator.
申请公布号 US2006136853(A1) 申请公布日期 2006.06.22
申请号 US20050220386 申请日期 2005.09.06
申请人 STMICROELECTRONICS PVT. LTD. 发明人 ADVANI HITEN
分类号 G06F9/45;G06F17/50 主分类号 G06F9/45
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