发明名称 Semiconductor device and fabrication method thereof
摘要 A semiconductor device includes a device isolation structure formed in a substrate so as to define a device region and a semiconductor device formed in the device region, wherein the device isolation structure includes a device isolation trench formed in the substrate so as to define the device region and a device isolation insulator filling the device isolation trench, the device isolation insulator including a lower part and an upper part, a stepped part being formed between the lower part and the upper part.
申请公布号 US2006131689(A1) 申请公布日期 2006.06.22
申请号 US20050062491 申请日期 2005.02.23
申请人 FUJITSU LIMITED 发明人 TSUKIDATE YOSHIKAZU
分类号 H01L21/76;H01L29/00 主分类号 H01L21/76
代理机构 代理人
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