发明名称 Semiconductor methods and structures
摘要 A method and a structure are provided for preventing lift-off of a semiconductor monitor pattern from a substrate. A semiconductor structure and a semiconductor monitor structure are formed on a substrate. A material layer is formed covering the semiconductor monitor structure. A part of the semiconductor structure is removed without removing the semiconductor monitor structure, by using the material layer as an etch protection layer. A mask for the method is also provided. The mask includes a clear area and a dark area. The dark area prevents a semiconductor monitor structure from being subjected to exposure so as to form a material layer covering the semiconductor monitor structure and prevent removal of the semiconductor monitor structure from the substrate while a part of a semiconductor structure is removed.
申请公布号 US2006131697(A1) 申请公布日期 2006.06.22
申请号 US20040019693 申请日期 2004.12.21
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 WU HUA-SHU;LAI TSUNG-MU;CHANG MING-CHIH;LAING CHE-RONG
分类号 H01L29/26;H01L21/30 主分类号 H01L29/26
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