发明名称 SOCKET FOR TEMPERATURE CHARACTERISTIC EVALUATION
摘要 PROBLEM TO BE SOLVED: To provide a socket for temperature characteristics evaluation that can stabilize a device under test at desired temperature, in a short period of time. SOLUTION: This socket is equipped with a socket body 3, and a lid 4 having a contact surface 18 making contact with a surface of the device 5 under test housed in a housing part 3a, in a state of being engaged with the socket body 3. The lid 4 comprises a inlet passage 22 boredly provided through the lid 4 in the thickness direction thereof for bringing a gas of a set temperature therein to guide it to the device 5; a slit 19 communicating with the passage 22, while dividing the contact surface 18 into two or more; and a blowout port 20 provided outside an edge end part of the contact surface 18 so as to communicate with the slit 19 and causing the gas, flowing through the slit 19, to be blown off into a space by the side of the device 5 housed in the housing part 3a. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006162254(A) 申请公布日期 2006.06.22
申请号 JP20040349375 申请日期 2004.12.02
申请人 SONY CORP 发明人 NAGANO KAZUO
分类号 G01R31/26 主分类号 G01R31/26
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