发明名称 |
Using a parametric measurement unit to sense a voltage at a device under test |
摘要 |
Circuitry for use in testing a device includes a first measurement unit to apply a forced voltage to the device, and a second measurement unit having functionality that is disabled. The second measurement unit includes a sense path to receive a sensed voltage from the device, where the sense path connects to the first measurement unit through the second measurement unit. The first measurement unit adjusts the forced voltage based on the sensed voltage.
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申请公布号 |
US2006132164(A1) |
申请公布日期 |
2006.06.22 |
申请号 |
US20040016354 |
申请日期 |
2004.12.17 |
申请人 |
WALKER ERNEST;SARTSCHEV RON |
发明人 |
WALKER ERNEST;SARTSCHEV RON |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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