发明名称 Lithographic apparatus and device manufacturing method
摘要 The present invention relates to a lithographic apparatus including an illumination system configured to condition a radiation beam, a patterning device support constructed to support a patterning device, the patterning device being capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam, a substrate support constructed to hold a substrate, and a projection system configured to project the patterned radiation beam onto a target portion of the substrate, wherein the lithographic apparatus includes an exchangeable object handling apparatus for exchanging an exchangeable object with an exchangeable object loading station and a support, the exchangeable object handling apparatus including three or more end-effectors each capable of exchanging an exchangeable object with one of the supports. Such lithographic apparatus is in particular suited for the streaming of subsequent double exposure jobs.
申请公布号 US2006132732(A1) 申请公布日期 2006.06.22
申请号 US20040015765 申请日期 2004.12.20
申请人 ASML NETHERLANDS B.V. 发明人 KUIT JAN J.
分类号 G03B27/42 主分类号 G03B27/42
代理机构 代理人
主权项
地址