BUILT-IN SELF-INSPECTING CIRCUIT, LSI, SEMICONDUCTOR DEVICE, AND SYSTEM BOARD

摘要

PROBLEM TO BE SOLVED: To appropriately perform tests for an external device, even for tests for the external device at initial stage.

SOLUTION: A clock for reading the output response of an external device 102 of a BIST circuit 107 is provided with a clock phase adjusting section 110 for automatically adjusting the phase of the clock. The clock phase adjusting section 110, before a test for the external device 102 by the BIST circuit 107, automatically adjusts the phase of the clock from a CLK-generating section 103, and setting the optimum phase of the clock. As a result, appropriate tests for the external device 102 by the BIST circuit 107 in the initial stage of test can be performed.

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