发明名称 METHOD FOR READING NON-VOLATILE MEMORY CELL
摘要 <p><P>PROBLEM TO BE SOLVED: To assure reliable reading. <P>SOLUTION: This method includes changing a read reference level for reading a group of memory cells as a function of changes in a threshold voltage distribution of a different group of memory cells. The changing step includes determining a history read reference level for correct reading of at least one history cell, selecting a memory read reference level according to a first read reference level and reading of a nonvolatile memory array cell associated with at least one history cell using the memory read reference level. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p>
申请公布号 JP2006164507(A) 申请公布日期 2006.06.22
申请号 JP20050355621 申请日期 2005.12.09
申请人 SAIFUN SEMICONDUCTORS LTD 发明人 MAAYAN EDUARDO;COHEN GUY;EITAN BOAZ
分类号 G11C16/06;G11C16/04 主分类号 G11C16/06
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