发明名称 |
METHOD FOR READING NON-VOLATILE MEMORY CELL |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To assure reliable reading. <P>SOLUTION: This method includes changing a read reference level for reading a group of memory cells as a function of changes in a threshold voltage distribution of a different group of memory cells. The changing step includes determining a history read reference level for correct reading of at least one history cell, selecting a memory read reference level according to a first read reference level and reading of a nonvolatile memory array cell associated with at least one history cell using the memory read reference level. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p> |
申请公布号 |
JP2006164507(A) |
申请公布日期 |
2006.06.22 |
申请号 |
JP20050355621 |
申请日期 |
2005.12.09 |
申请人 |
SAIFUN SEMICONDUCTORS LTD |
发明人 |
MAAYAN EDUARDO;COHEN GUY;EITAN BOAZ |
分类号 |
G11C16/06;G11C16/04 |
主分类号 |
G11C16/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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