发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device that can mixedly mount low-voltage operative and high-voltage operating MOSFETs on the same semiconductor substrate, and can set threshold voltages appropriate to various circuit operations. SOLUTION: The semiconductor device is formed on a substrate, is of the same conductivity type and has the same gate insulation material, and is equipped with a plurality of MOSFETs, having gate insulation films with a film thickness out of several kinds of film thicknesses, while the gate electrode 9 for a MOSFET with a thin gate insulating film (a first gate insulating film) 6 is structured with a silicide 15a, and the gate electrode 10 for a MOSFET with a gate insulating film (a second gate insulating film) 5 that is thicker than the first one is structured with a silicide 7a formed on a polycrystal or amorphous material Si or SiGe7 and the polycrystal or amorphous Si or SiGe. An optimum gate electrode can be provided to each of low-voltage and high-voltage operating MOSFETs mounted on one semiconductor substrate in a mixed way, thus enabling a threshold voltage to be set that is suitable for various circuit operations. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006165435(A) 申请公布日期 2006.06.22
申请号 JP20040357910 申请日期 2004.12.10
申请人 TOSHIBA CORP 发明人 ISHIMARU KAZUNARI
分类号 H01L21/8234;H01L27/08;H01L27/088;H01L29/786 主分类号 H01L21/8234
代理机构 代理人
主权项
地址