| 摘要 |
PROBLEM TO BE SOLVED: To provide a device power supply control technique of semiconductor tester, and to provide a device thereof. SOLUTION: The device for testing the semiconductor device contains a power supply section generating power which is supplied to the semiconductor device, in response to the control of the test controller, a voltage transmission section for transmitting the power to the semiconductor device responding to control of the test controller, and an overcurrent detecting section for detecting whether current is supplied excessively from the power supply section and the output. In particular, the voltage transmission section is constituted so as to interrupt power supply to the semiconductor device, in response to the output from the overcurrent detecting section. without the intervention of the test controller. COPYRIGHT: (C)2006,JPO&NCIPI
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