发明名称 HERMETICITY EVALUATION EQUIPMENT AND HERMETICITY EVALUATION METHOD
摘要 PROBLEM TO BE SOLVED: To evaluate the hermeticity with high accuracy in a short time even with a little emission of He at the time of evaluating the hermeticity of a hermetically sealed package, etc. which has a high degree of hermeticity and therefore is difficult to evaluate by the He leakage measurement method. SOLUTION: Inside a chamber 1, the package 2 wherein a semiconductor device such as a diode impregnated with He gas is sealed is arranged. A spiral pipe 4 which is a gas selection pipe which causes a difference in speed depending on the type of gas is connected to the chamber 1. To the other end of the spiral pipe 4, a He leakage detector 6 which is a gas detector for detecting the He gas emitted from the package 2 is connected. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006165024(A) 申请公布日期 2006.06.22
申请号 JP20040349683 申请日期 2004.12.02
申请人 MITSUBISHI ELECTRIC CORP 发明人 KINUGAWA MASARU
分类号 H01L23/20 主分类号 H01L23/20
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