发明名称 METHOD AND DEVICE FOR PRODUCING PROBE POINT OF NANOSTRUCTURE
摘要 PROBLEM TO BE SOLVED: To provide a probe point producing method of a nano structure, capable of producing a very fine probe point and controlling the growth direction, and to provide its production device. SOLUTION: In the probe point producing method of the nanostructure, a previously produced probe 23 is made to approach a catalyst substrate 22, the probe 23 and catalyst substrate 22 are held in a liquid 24, catalyst material is diffused to the probe 23 point or plating is produced, by making a current from a voltage source 25 flow between the probe 23 and the liquid 24. Thereafter, the catalyst substrate 22 made to approach is moved away. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006162608(A) 申请公布日期 2006.06.22
申请号 JP20050333021 申请日期 2005.11.17
申请人 JAPAN SCIENCE & TECHNOLOGY AGENCY 发明人 KAWAKATSU HIDEKI
分类号 B82B3/00;C01B31/02;G01Q60/38;G01Q70/00;G01Q70/12;G01Q70/16 主分类号 B82B3/00
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