发明名称 FORMING METHOD AND EQUIPMENT OF INTERLAYER CONNECTION OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of performing a UV cure treatment without affecting a low-k film of a lower layer in multilevel interconnection technology of a semiconductor. SOLUTION: The method of forming a film multilayer connection structure on a semiconductor substrate using a plasma CVD equipment consists of a process of forming a low dielectric constant film on substrate, a process of curing by radiating UV (ultraviolet rays) to the low dielectric constant film, a process of laminating a UV blocking film, a process of laminating a next low dielectric constant film, and a process of curing by radiating the UV to the next low dielectric constant film, where the extinction coefficient of the UV blocking film to the wavelength of the radiated UV is 0.2 or more. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006165573(A) 申请公布日期 2006.06.22
申请号 JP20050353131 申请日期 2005.12.07
申请人 ASM JAPAN KK 发明人 MATSUSHITA KIYOHIRO;OBARA NAOKI;NATANAEL RAYMOND GRETCHEN KEMELING
分类号 H01L21/312;C23C16/42;H01L21/31;H01L21/314;H01L21/316;H01L21/318;H01L21/768;H01L23/522 主分类号 H01L21/312
代理机构 代理人
主权项
地址