发明名称 Power supply device and electric circuit
摘要 An FET for malfunction check is connected between the gate and source of an FET for power-source output control, which is connected in series in a power output line from a battery used as a power source for a load. A malfunction determination circuit determines whether the FET for power-source output control is operating normally or not, by monitoring output voltage of the FET for malfunction check. Further, the malfunction determination circuit identifies malfunction of the FET for power-source output control due to short-circuiting during actual use.
申请公布号 US2006132142(A1) 申请公布日期 2006.06.22
申请号 US20050305221 申请日期 2005.12.19
申请人 SANYO ELECTRIC CO., LTD. 发明人 KABASAWA TAKASHI
分类号 G01R31/00;G05F1/10;H02J7/00;H02M1/00 主分类号 G01R31/00
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