| 摘要 |
PROBLEM TO BE SOLVED: To provide an automatic high frequency test system which executes different kinds of tests simultaneously to a plurality of test pieces without attaching or detaching the plurality of test pieces loaded on the test system, automatically switches waveguide connections successively and executes all test items to all the test pieces for the purpose of improving the test efficiency of the product test of high frequency electronic equipment and shortening test time. SOLUTION: The automatic high frequency test system comprises: M pieces of signal sources 5 corresponding to respective high frequency measuring devices; a changeover switch 6 on the input side of the test pieces from the respective signal sources capable of switching the connection of a waveguide in L kinds at the time of defining the larger value of M and N as L and the smaller one as K; and a changeover switch 7 on the output side to the high frequency measuring device from the output of the test pieces capable of switching the connection of the waveguide in L kinds. By simultaneously measuring the K pieces of the test pieces in parallel and repeating changeover by the input side changeover switch 6 and simultaneous measurement, a high frequency test is executed to all the test pieces. COPYRIGHT: (C)2006,JPO&NCIPI
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