发明名称 Apparatus and method for ion production enhancement
摘要 <p>The present invention relates to an apparatus and method for use with a mass spectrometer. The ion enhancement system of the present invention is used to direct a heated gas toward ions produced by a matrix based ion source and detected by a detector. The ion enhancement system is interposed between the ion source and the detector. The analyte ions that contact the heated gas are enhanced and an increased number of ions are more easily detected by a detector. The method of the invention comprises producing analyte ions from a matrix based ion source, enhancing the analyte ions with an ion enhancement system and detecting the enhanced analyte ions with a detector.</p>
申请公布号 EP1672675(A2) 申请公布日期 2006.06.21
申请号 EP20050009726 申请日期 2005.05.03
申请人 AGILENT TECHNOLOGIES, INC. 发明人 TRUCHE, JEAN-LUC;BAI, JIAN;JOYCE, TIMOTHY
分类号 H01J49/16;H01J49/04 主分类号 H01J49/16
代理机构 代理人
主权项
地址