发明名称 |
PHASE-CHANGE RAM CONTAINING ALN THERMAL DISSIPATION LAYER AND TIN ELECTRODE |
摘要 |
<p>Provided is a phase-change RAM containing a substrate, a lower electrode, a phase-change material, an upper electrode and a thermal dissipation layer, wherein the thermal dissipation layer contains an aluminum-nitride thermal dissipation layer having a high heat conductivity, and the lower electrode contains a titanium-nitride electrode which generates a great amount of heat generated using a small amount of current and has a low heat conductivity, whereby heat generated between the phase-change material and the electrode is not transferred to the interior of a device but fast dissipated to the exterior thereof, so as to enable a high speed operation using low current and improve reliability of the device.</p> |
申请公布号 |
KR20060068546(A) |
申请公布日期 |
2006.06.21 |
申请号 |
KR20040107265 |
申请日期 |
2004.12.16 |
申请人 |
KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
KIM, SEONG IL;KIM, YONG TAE;KIM, YOUNG HWAN;KIM, CHUN KEUN;YOUM, MIN SOO |
分类号 |
H01L21/8247;H01L27/115 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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