发明名称 Method of forming a multi-layer semiconductor structure having a seamless bonding interface
摘要 A method of forming a multi-layer semiconductor structure includes providing a first layer of a patterned copper bond film having a first predetermined thickness onto a first surface of a first semiconductor. The method further includes providing a second layer of a patterned copper bond film having a second predetermined thickness onto a first surface of a second semiconductor. The first and second semiconductor structures can be aligned, such that the first and second patterned copper bond films are disposed in proximity. A virtually seamless bond can be formed between the first and second patterned copper bond films to provide the first and second semiconductors as the multi-layer semiconductor structure.
申请公布号 US7064055(B2) 申请公布日期 2006.06.20
申请号 US20030655670 申请日期 2003.09.05
申请人 MASSACHUSETTS INSTITUTE OF TECHNOLOGY 发明人 REIF RAFAEL;FAN ANDY
分类号 H01L21/4763;H01L21/60;H01L23/48;H01L23/522;H01L25/065 主分类号 H01L21/4763
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