发明名称 Method and apparatus for ion beam profiling
摘要 An ion beam current density profiler includes a pair of counter-rotating cylindrical masks each featuring a helical slot. The intersection of the slots forms an aperture that scans the width of a ribbon ion beam to allow discrete portions of the beam to impact an inner, concentric current collecting cylinder.
申请公布号 US7064340(B1) 申请公布日期 2006.06.20
申请号 US20040012585 申请日期 2004.12.15
申请人 AXCELIS TECHNOLOGIES, INC. 发明人 VANDERBERG BO H.;CRISTOFORO MICHAEL P.;WENZEL KEVIN W.
分类号 H01J37/317 主分类号 H01J37/317
代理机构 代理人
主权项
地址