发明名称 Attenuator test system
摘要 System for testing attenuators by a flatness and standing wave ratio tests which includes a vector network analyzer (VNA) adapted to be coupled to a device under test (DUT) and which provides an input stimulus signal for the DUT and, when certain conditions are satisfied, receives an output signal from the DUT, and a calibration receiver adapted to be coupled to the DUT via a down-converter. When certain conditions are satisfied, the output signal from the DUT is sent to the calibration receiver (through the down-converter to be possibly modified thereby depending on the testing frequency). A signal generator provides a local oscillator (LO) signal for the down-converter. A control unit is connected to the instruments and embodies software which analyzes the testing conditions, i.e., the attenuator value being tested, and selects whether the network analyzer or the calibration receiver will measure the output signal from the DUT.
申请公布号 US7065466(B2) 申请公布日期 2006.06.20
申请号 US20040767038 申请日期 2004.01.29
申请人 ADVANCED TESTING TECHNOLOGIES, INC. 发明人 CLARKE JEFFREY R.;BUCKLEY ROBERT M.;SILHAN DEAN R.
分类号 G06F19/00;G01R27/28 主分类号 G06F19/00
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