发明名称 Ferroelectric memory devices having an expanded plate electrode
摘要 Ferroelectric memory devices are formed on an integrated circuit substrate. A bottom interlayer dielectric layer is positioned on the integrated circuit substrate and a plurality of ferroelectric capacitors are arranged in a row and column relationship on the bottom interlayer dielectric layer. A top interlayer dielectric layer is disposed on a surface of the integrated circuit substrate including the plurality of ferroelectric capacitors. The top interlayer dielectric layer includes via holes disposed on and associated with ones of the ferroelectric capacitors. A plate electrode is formed in the top interlayer dielectric layer. The plate electrode extends into respective ones of the via holes to contact top surfaces of at least two neighboring ones of the plurality of ferroelectric capacitors. Methods or fabricating ferroelectric memory devices are also provided.
申请公布号 US7064366(B2) 申请公布日期 2006.06.20
申请号 US20040787424 申请日期 2004.02.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG HYUN-YUL;SONG YOON-JONG;JANG NAK-WON
分类号 H01L27/04;H01L29/76;G11C11/22;H01L21/8246;H01L27/115;H01L29/94;H01L31/062;H01L31/109;H01L31/113;H01L31/119 主分类号 H01L27/04
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