HIGH-RESOLUTION WAVEFRONT MEASUREMENT METHOD AND APPARATUS,申请号KR20040105272-传众专利搜索

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发明名称	HIGH-RESOLUTION WAVEFRONT MEASUREMENT METHOD AND APPARATUS
摘要
申请公布号	KR20060066802(A)	申请公布日期	2006.06.19
申请号	KR20040105272	申请日期	2004.12.14
申请人	KOREA ATOMIC ENERGY RESEARCH INSTITUTE	发明人	BAIK, SUNG HOON;PARK, SEUNG KYU;CHA, BYUN GHEON
分类号	G01J9/00;G01M11/02	主分类号	G01J9/00
代理机构		代理人
主权项
地址

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