发明名称 Self-aligned V0-contact for cell size reduction
摘要 An FeRAM comprising includes a ferroelectric material sandwiched between a top electrode and a bottom electrode. A V0-contact provides an electrical connection with an underlying CS-contact. The V0-contact is aligned using the bottom electrode. A liner layer covers a sidewall of the bottom electrode and provides a stop to an etch a hole forming the V0-contact. A method is utilized to form a V0-contact in an FeRAM comprising. An Fe capacitor of the FeRAM is encapsulated, a bottom electrode is etched, a liner layer is deposited covering a sidewall of the bottom electrode, and a hole is etched for the VO-contact until the etching is stopped by the liner layer.
申请公布号 US7061035(B2) 申请公布日期 2006.06.13
申请号 US20030677852 申请日期 2003.10.01
申请人 INFINEON TECHNOLOGIES AG 发明人 LIAN JINGYU;NAGEL NICOLAS;GERNHARDT STEFAN;BRUCHHAUS RAINER;HILLIGER ANDREAS;WELLHAUSEN UWE
分类号 H01L29/94;H01L21/02;H01L21/60 主分类号 H01L29/94
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