发明名称 Etch of silicon nitride selective to silicon and silicon dioxide useful during the formation of a semiconductor device
摘要 A method for etching silicon nitride selective to silicon dioxide and silicon (polycrystalline silicon or monocrystalline silicon) comprises the use of oxygen along with an additional etchant of either CHF<SUB>3 </SUB>or CH<SUB>2</SUB>F<SUB>2</SUB>. Flow rates, power, and pressure settings are specified.
申请公布号 US7060629(B2) 申请公布日期 2006.06.13
申请号 US20040819517 申请日期 2004.04.06
申请人 发明人
分类号 H01L21/302;H01L21/311 主分类号 H01L21/302
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