发明名称 |
EQUIPMENT OF INSPECTION OF SEMICONDUCTOR CHIP AND METHOD OF INSPECTING SEMICONDUCTOR CHIP USING THE SAME |
摘要 |
An apparatus includes a test board for testing electrical characteristics of the semiconductor chip; socket pins vertically disposed on the test board to electrically connect the test board, and external terminals of the semiconductor chip; socket springs interposed between the socket pins and the test board and making the socket pins vertically elastic; a plurality of laser beam transmitters vertically penetrating the socket pins, the socket springs, and the test board; and a laser beam source supplying laser beams to the laser beam transmitters. |
申请公布号 |
KR20060064292(A) |
申请公布日期 |
2006.06.13 |
申请号 |
KR20040103096 |
申请日期 |
2004.12.08 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KO, JUN YOUNG;YOON, SEOK YOUNG;JOUNG, HYECK JIN |
分类号 |
G01R31/26;H01L21/66 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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