发明名称 Semiconductor integrated circuit
摘要 Even when variation in transistor characteristic, resistance or the like occurs during manufacturing, a noise component is always minimized. Each of k clock phase difference generating circuits 16-18 shifts a phase of a basic clock signal ADCK 1 by a specified different value to obtain a clock signal ADCK 2 and supplies the clock signal ADCK 2 to an A/D converter. A k counter 19 successively selects the clock phase difference generating circuits 16-18 and stores a noise component in an output of the A/D converter measured by a noise measuring circuit 27 in a corresponding register. A comparator 25 compares k noise components and obtains the number j of the clock phase difference generating circuit giving a minimum value. A selection circuit 26 fixedly selects only the j-th clock phase difference generating circuit. Thus, even when variation in the transistor characteristics or resistance occurs in each device in a manufacturing stage, the clock signal ADCK 2 obtained by shifting the phase of the basic clock signal ADCK 1 can be supplied to the A/D converter so that a noise component is minimized for each device.
申请公布号 US7061530(B2) 申请公布日期 2006.06.13
申请号 US20010883990 申请日期 2001.06.20
申请人 SHARP KABUSHIKI KAISHA 发明人 KOYAMA EIJI
分类号 H01L27/146;H01L21/822;H01L27/04;H03K9/08;H03L7/00;H03M1/08;H04N5/232;H04N5/335;H04N5/357;H04N5/369;H04N5/378 主分类号 H01L27/146
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