发明名称 Integrated system for processing semiconductor wafers
摘要 An integrated process tool for chemical mechanical processing, cleaning and drying a semiconductor workpiece is provided. The integrated process tool includes a CMP module and a cleaning and drying module. After being processed, the workpiece is transported from the CMP module to the cleaning and drying module using a movable housing. In the cleaning and drying module, a cleaning mechanism is used to clean the workpiece while the workpiece is rotated and held by a support stucture of the movable housing. A drying mechanism of the cleaning and drying module picks up the workpiece from the moveable housing and spin dries it. Throughout the CMP process, cleaning and drying, the processed surface of the wafer faces down.
申请公布号 US7059944(B2) 申请公布日期 2006.06.13
申请号 US20030369118 申请日期 2003.02.18
申请人 发明人
分类号 B24B1/00;G05B19/418;H01L21/00;H01L21/677;H01L21/687 主分类号 B24B1/00
代理机构 代理人
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