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发明名称
Method of measuring a thin film thickness
摘要
申请公布号
KR100588988(B1)
申请公布日期
2006.06.13
申请号
KR20030063447
申请日期
2003.09.09
申请人
发明人
分类号
G01B11/06
主分类号
G01B11/06
代理机构
代理人
主权项
地址
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