发明名称 |
Increased drive current by isotropic recess etch |
摘要 |
A method ( 100 ) of forming a transistor includes forming a gate structure ( 108 ) over a semiconductor body and forming recesses ( 112 ) using an isotropic etch using the gate structure as an etch mask. The isotropic etch forms a recess in the semiconductor body that extends laterally in the semiconductor body toward a channel portion of the semiconductor body underlying the gate structure. The method further includes epitaxially growing silicon ( 114 ) comprising stress-inducing species in the recesses. The source and drain regions are then implanted ( 120 ) in the semiconductor body on opposing sides of the gate structure.
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申请公布号 |
US7060579(B2) |
申请公布日期 |
2006.06.13 |
申请号 |
US20040902360 |
申请日期 |
2004.07.29 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
CHIDAMBARAM PR;HALL LINDSEY;BU HAOWEN |
分类号 |
H01L21/336;H01L21/3205;H01L21/4763;H01L21/76 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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