发明名称 Increased drive current by isotropic recess etch
摘要 A method ( 100 ) of forming a transistor includes forming a gate structure ( 108 ) over a semiconductor body and forming recesses ( 112 ) using an isotropic etch using the gate structure as an etch mask. The isotropic etch forms a recess in the semiconductor body that extends laterally in the semiconductor body toward a channel portion of the semiconductor body underlying the gate structure. The method further includes epitaxially growing silicon ( 114 ) comprising stress-inducing species in the recesses. The source and drain regions are then implanted ( 120 ) in the semiconductor body on opposing sides of the gate structure.
申请公布号 US7060579(B2) 申请公布日期 2006.06.13
申请号 US20040902360 申请日期 2004.07.29
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 CHIDAMBARAM PR;HALL LINDSEY;BU HAOWEN
分类号 H01L21/336;H01L21/3205;H01L21/4763;H01L21/76 主分类号 H01L21/336
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