发明名称 Method for forming a junction region of a semiconductor device
摘要 A method for forming a junction region of a semiconductor device is disclosed. The steps of the method include providing a semiconductor substrate. A gate structure is formed on the semiconductor substrate. A dopant is implanted into the semiconductor substrate to form the junction region. An insulator layer is formed on the gate structure and the semiconductor substrate. A carbon-containing plasma treatment is performed to the insulator layer. A spacer is formed on a side-wall of the gate structure and the dopant is implanted into the semiconductor substrate to form a source/drain region next to the junction region. A heat treatment is performed to the semiconductor substrate.
申请公布号 US7060547(B2) 申请公布日期 2006.06.13
申请号 US20040764437 申请日期 2004.01.27
申请人 UNITED MICROELECTRONICS CORP. 发明人 CHEN YU-KUN;YANG NENG-HUI;CHIEN CHIN-CHENG;WANG HSIANG-YING
分类号 H01L21/336;H01L21/225;H01L21/28;H01L21/4763;H01L29/49;H01L29/78 主分类号 H01L21/336
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