发明名称 ARRANGEMENT FOR MEASURING SMALL LINEAR DISPLACEMENTS
摘要 FIELD: the invention refers to measuring technique. ^ SUBSTANCE: the arrangement for measuring small linear displacements has two phase diffraction gratings, a feeler, which is introduced into a contact with a research sample. In also has a system for transilluminating the gratings with a laser beam containing a laser with a beam collimator, a spacing filter, a photodiode and an output voltage meter. Besides diffraction gratings are marked on two opposite parallel sides of a transparent block. The block is fastened on an axle and has a rotating degree of freedom relatively to this axle and is connected with the feeler so that the vector of displacement impacting on the feeler passes at a certain distance from the axle of rotating of the block. The system for transilluminating of the gratings is installed on a separate turning foundation connected with a regulating mechanism. ^ EFFECT: excludes an angle misalignment of the diffraction gratings in the process of work, achievement of small pressure on the feeler at measuring linear displacement of a sensitive attachment of the sensor-the gratings' block. ^ 1 dwg
申请公布号 RU2277695(C1) 申请公布日期 2006.06.10
申请号 RU20040135369 申请日期 2004.12.06
申请人 发明人 KOMOTSKIJ VLADISLAV ANTONOVICH;KOROL'KOV VLADISLAV IVANOVICH
分类号 G01B11/00 主分类号 G01B11/00
代理机构 代理人
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