发明名称 |
ENVIRONMENT MEASURING ELEMENT AND ENVIRONMENT MEASURING METHOD USING IT |
摘要 |
PROBLEM TO BE SOLVED: To provide an environment measuring element constituted so as to be capable of evaluating an environment rapidly and inexpensively. SOLUTION: The environment measuring element is constituted of a substrate and the thin film formed on the surface of the substrate. The thin film contains two or above kinds of metals different in reactivity corresponding to the kind of gas and is continuously or intermittently different in composition at every position on the surface of the substrate and different in hue after reaction corresponding to the composition and the kind of a gas to be reacted. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2006145390(A) |
申请公布日期 |
2006.06.08 |
申请号 |
JP20040336100 |
申请日期 |
2004.11.19 |
申请人 |
TOSHIBA CORP;SHIBAFU ENGINEERING CORP |
发明人 |
YAMAMOTO ATSUSHI;WAKAMATSU KENGO;TODO YOKO;OKUTOMI ISAO;KODERA SHIGEHITO |
分类号 |
G01N21/78;G01N21/77 |
主分类号 |
G01N21/78 |
代理机构 |
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代理人 |
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地址 |
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