发明名称 Method for measuring contour variations
摘要 A method for measuring a contour variation of a measuring area on an object. The method includes the steps of: irradiating the measuring area with a light beam, wherein reflection or transmission of the beam occurs; splitting the transmitted or reflected beam; combining the split beams with each other and observing a fringe pattern representing a differential phase between the split beams; varying the phase of the split beams relative to each other, such that the differential phase is kept within the range of 2 pi; calculating an optical path length difference from the differential phase; and relating the optical path length difference to the contour variation of the object.
申请公布号 US2006119861(A1) 申请公布日期 2006.06.08
申请号 US20050527410 申请日期 2005.12.27
申请人 SAUNDERS IAN;KORPERSHOEK JACOBUS J;BRUG HEDSER V 发明人 SAUNDERS IAN;KORPERSHOEK JACOBUS J.;BRUG HEDSER V.
分类号 G01B11/02;G01B9/02;G01B11/24 主分类号 G01B11/02
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