发明名称 Exposure apparatus, evaluation method and device fabrication method
摘要 An exposure apparatus for exposing a pattern of a mask onto an object, said exposure apparatus includes a light source part that includes a generating mechanism for generating a plasma, a condenser mirror for condensing a light radiated from the plasma, and a vacuum chamber for accommodating the generating mechanism and the condenser mirror, and has an opening that is provided at a position approximately corresponding to a position of a condensing point of the light condensed by the condenser mirror, an illumination optical system for illuminating the mask using the light from the light source part, a detector for detecting the light from the condensing point at an emission side of the condensing point, and an evaluation part for evaluating a life of the light source part based on a detected result by the detector.
申请公布号 US2006119828(A1) 申请公布日期 2006.06.08
申请号 US20050267755 申请日期 2005.11.03
申请人 ITO JUN;YAMAMOTO TAKESHI 发明人 ITO JUN;YAMAMOTO TAKESHI
分类号 G03B27/72 主分类号 G03B27/72
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