ELECTROOPTIC APPARATUS SUBSTRATE AND METHOD OF EXAMINING SAME, ELECTROOPTIC APPARATUS, AND ELECTRONIC EQUIPMENT

摘要

PROBLEM TO BE SOLVED: To provide an electrooptic apparatus substrate and examination method therefor which can implement an examination without requiring bringing a probe into contact thereto from the outside and with satisfactory measuring accuracy. SOLUTION: The substrate 1 includes a video line 7 and transmission gate portion 6 through multiple switching elements for writing a first potential signal in multiple pixels through a signal line. The substrate 1 further includes a display data reading circuit portion 4 having a differential amplifier 4a for lowering a lower potential and heightening a higher potential and outputting it to the signal line and a transmission gate portion 6 and video line 7 for reading the first potential signal and a reference second potential signal. COPYRIGHT: (C)2006,JPO&NCIPI