发明名称 WAVELENGTH MEASUREMENT DEVICE AND CALIBRATION METHOD FOR SAME
摘要 PROBLEM TO BE SOLVED: To provide a wavelength measurement device and a calibration method for the same which is high in reliability and capable of calibrating the wavelength in a short time. SOLUTION: The wavelength measurement device for measuring the wavelength which calibrates itself by reference light from the reference light source is obtained by improving the conventional one. This device is characteristically provided with an optical coupler for coupling the reference light from the reference light source and the light to be measured, and a wavelength measurement part with a plurality of measurement ranges, the input side of which is connected with the optical coupler and measures the wavelength at the time of calibration with the measurement range other than the measurement range for measuring the light to be measured. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006145337(A) 申请公布日期 2006.06.08
申请号 JP20040334537 申请日期 2004.11.18
申请人 YOKOGAWA ELECTRIC CORP 发明人 TANAKA NAO;KOMIYAMA MAKOTO
分类号 G01J9/00;G01J3/02 主分类号 G01J9/00
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