发明名称 SEMICONDUCTOR STRUCTURE HAVING STRAINED SEMICONDUCTOR AND METHOD THEREFOR
摘要 A first semiconductor structure (10) has a silicon substrate (12), a first silicon germanium layer (14) grown on the silicon, a second silicon germanium layer (16) on the first silicon germanium layer (14), and a strained silicon layer (18) on the second silicon germanium layer (16). A second semiconductor structure (22) has a silicon substrate (24) and an insulating top layer (26). The silicon layer (18) of the first semiconductor structure (10) is bonded to the insulator layer (26) to form a third semiconductor structure (30). The second silicon germanium layer (16) is cut to separate most of the first semiconductor structure (10) from the third semiconductor structure (30). The silicon germanium layer (16) is removed to expose the strained silicon layer (18) where transistors (32 & 34) are subsequently formed, which is then the only layer remaining from the first semiconductor structure (10). The transistors (32 & 34) are oriented along the <100> direction and at a 45 degree angle to the <100> direction of the base silicon layer (24) of the second semiconductor structure.
申请公布号 WO2005081748(A3) 申请公布日期 2006.06.08
申请号 WO2005US01532 申请日期 2005.01.12
申请人 FREESCALE SEMICONDUCTOR, INC.;BARR, ALEXANDER, L.;JOVANOVIC, DEJAN;NGUYEN, BICH-YEN;SADAKA, MARIAM, G.;THEAN, VOON-YEW;WHITE, TED, R. 发明人 BARR, ALEXANDER, L.;JOVANOVIC, DEJAN;NGUYEN, BICH-YEN;SADAKA, MARIAM, G.;THEAN, VOON-YEW;WHITE, TED, R.
分类号 H01L21/336;H01L21/00;H01L21/46;H01L21/762;H01L21/8234;H01L21/8238;H01L21/84;H01L27/12;H01L29/04 主分类号 H01L21/336
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